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This puts the tester inside the chip. Logic BIST (LBIST) and Memory BIST (MBIST) allow the device to test itself at full clock speed, which is essential for detecting "at-speed" defects that slow testers might miss. At 3 AM on Thursday, they had it: a sequence of 47 test vectors. It looked like gibberish—a cascade of 1s and 0s—but it was a skeleton key. | |
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Îïåðàöèÿ "Ñâÿòîé Ïëàù"
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